• 文献标题:   Verification of electron doping in single-layer graphene due to H-2 exposure with thermoelectric power
  • 文献类型:   Article
  • 作  者:   HONG SJ, PARK M, KANG HJ, LEE M, SOLERDELGADO D, SHIN DS, KIM KH, KUBATKIN S, JEONG DH, PARK YW, KIM BH
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Seoul Natl Univ
  • 被引频次:   8
  • DOI:   10.1063/1.4917470
  • 出版年:   2015

▎ 摘  要

We report the electron doping of single-layer graphene (SLG) grown by chemical vapor deposition (CVD) by means of dissociative hydrogen adsorption. The transfer characteristic showed n-type doping behavior similar to that of mechanically exfoliated graphene. Furthermore, we studied the thermoelectric power (TEP) of CVD-grown SLG before and after exposure to high-pressure H-2 molecules. From the TEP results, which indicate the intrinsic electrical properties, we observed that the CVD-grown SLG is n-type doped without degradation of the quality after hydrogen adsorption. Finally, the electron doping was also verified by Raman spectroscopy. (C) 2015 AIP Publishing LLC.