• 文献标题:   Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy
  • 文献类型:   Article
  • 作  者:   YAN L, PUNCKT C, AKSAY IA, MERTIN W, BACHER G
  • 作者关键词:   functionalized graphene, kelvin probe force microscopy, electrical conductivity, contact resistance, sheet resistance
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Duisburg Essen
  • 被引频次:   62
  • DOI:   10.1021/nl201070c
  • 出版年:   2011

▎ 摘  要

We studied the local voltage drop in functionalized graphene sheets of sub mu m size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic current-voltage characteristics and an intrinsic conductivity of about 3.7 x 10(5) S/m corresponding to a sheet resistance of 2.7 k Omega/sq under ambient conditions for graphene produced via thermal reduction of graphite oxide. The contact resistivity between functionalized graphene and metal electrode was found. to be <6.3 x 10(-7) Omega cm(2).