• 文献标题:   Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   BLANTON TN, MAJUMDAR D
  • 作者关键词:   graphene, graphene oxide, xrd, xps, afm
  • 出版物名称:   POWDER DIFFRACTION
  • ISSN:   0885-7156 EI 1945-7413
  • 通讯作者地址:   Eastman Kodak Co
  • 被引频次:   31
  • DOI:   10.1017/S0885715613000109
  • 出版年:   2013

▎ 摘  要

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive. (C) 2013 International Centre for Diffraction Data.