• 文献标题:   Patterning graphene with a helium ion microscope: Observation of metal-insulator transition induced by disorder
  • 文献类型:   Article
  • 作  者:   ARAUJO END, BRANT JC, ARCHANJO BS, MEDEIROSRIBEIRO G, PLENTZ F, ALVES ES
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Univ Fed Minas Gerais
  • 被引频次:   5
  • DOI:   10.1103/PhysRevB.91.245414
  • 出版年:   2015

▎ 摘  要

A helium ion microscope is used to produce nanoscale patterns on different regions of a graphene device. The patterns consist of uniformly spaced strips with varying spacing in each region. Measurements of the longitudinal magnetoconductivity in each region at different temperatures and carrier densities reveal a transition from metallic to insulating regimes as the density of defects increases. We use the weak localization theory and Mott's theory for disordered two-dimensional systems to analyze the conductivity as it crosses the threshold value of 4e(2)/h.