• 文献标题:   Optical investigation of reduced graphene oxide by spectroscopic ellipsometry and the band-gap tuning
  • 文献类型:   Article
  • 作  者:   SHEN Y, ZHOU P, SUN QQ, WAN L, LI J, CHEN LY, ZHANG DW, WANG XB
  • 作者关键词:   ellipsometry, graphene, monolayer, optical constant, raman spectra, visible spectra
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Fudan Univ
  • 被引频次:   29
  • DOI:   10.1063/1.3646908
  • 出版年:   2011

▎ 摘  要

Spectroscopic ellipsometry was used to characterize the optical response of few layer reduced graphene oxide and graphene oxide in visible range. Lorentz oscillator model is added to analyze the ellipsometric parameters. The experiment shows the optical response of few layer reduced graphene oxide and monolayer exfoliated graphene in visible range is quite similar with slight difference due to the structure defects. The Lorentz oscillator model gives experimental support to investigate the band-gap tuning through the reduction process in details. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3646908]