• 文献标题:   Flipping nanoscale ripples of free-standing graphene using a scanning tunneling microscope tip
  • 文献类型:   Article
  • 作  者:   BREITWIESER R, HU YC, CHAO YC, LI RJ, TZENG YR, LI LJ, LIOU SC, LIN KC, CHEN CW, PAI WW
  • 作者关键词:  
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:   Natl Taiwan Univ
  • 被引频次:   12
  • DOI:   10.1016/j.carbon.2014.05.026
  • 出版年:   2014

▎ 摘  要

We present a scanning tunneling microscopy study of the stress-strain behavior of a rippled single-layer free-standing graphene (FSG) and report that FSG exhibits a non-linear sigmoidal stress-strain behavior. We managed to pull and push nanoripples by controlling the STM tip-FSG interaction forces. In this way, we found that the initial deformations of a rippled FSG involve sign reversals of the nanoripple's local curvatures, termed "flipping". In contrast to elastic deformation of graphene, flipping of a FSG nanoripple encounters a stress barrier and therefore makes a rippled FSG metastable, as evidenced by monitoring a yielding process in both experiments and molecular dynamics simulations. The evolution of nanoripples subjected to STM control is also fully consistent with atom-resolved images. Our work therefore shows how rippled 2D carbon deforms at nanoscale. (C) 2014 Elsevier Ltd. All rights reserved.