▎ 摘　　要

We demonstrate how abreaction corrected transmission electron microscopy (TEM) analysis techniques that are commonly used in nanostructure characterization can be used to study the morphology of graphene and other 2D materials at atomic scale, even subangstrom scale, and evolution of nanostructure and from which we determine the graphene components nanofabrication process. The key contributions of this work are perhaps focused on two areas: (1) recent progress on graphene characterization from the TEM aspect and (2) how the electron beam can be used to fabricate nanoribbon from graphene or similar 2D material.