▎ 摘　　要

Series connection of four quantum Hall effect (QHE) devices based on epitaxial graphene films was studied for realization of a quantum resistance standard with an up-scaled value. The tested devices showed quantum Hall plateaux R-H,R-2 at a filling factor upsilon = 2 starting from a relatively low magnetic field (between 4 T and 5 T) when the temperature was 1.5 K. The precision measurements of quantized Hall resistance of four QHE devices connected by triple series connections and external bonding wires were done at B = 7 T and T = 1.5K using a commercial precision resistance bridge with 50 mu A current through the QHE device. The results showed that the deviation of the quantized Hall resistance of the series connection of four graphene-based QHE devices from the expected value of 4 x R-H,R-2 = 2 h/e(2) was smaller than the relative standard uncertainty of the measurement (< 1 x 10(-7)) limited by the used resistance bridge. Published by AIP Publishing.