• 文献标题:   Optimized poly(methyl methacrylate)-mediated graphene-transfer process for fabrication of high-quality graphene layer
  • 文献类型:   Article
  • 作  者:   PARK H, LIM C, LEE CJ, KANG J, KIM J, CHOI M, PARK H
  • 作者关键词:   cvdgraphene, transfer proces, residue, wrinkle, uniformity
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:   Kyungpook Natl Univ
  • 被引频次:   3
  • DOI:   10.1088/1361-6528/aad4d9
  • 出版年:   2018

▎ 摘  要

Graphene grown on a copper (Cu) substrate by chemical vapor deposition (CVD) is typically required to be transferred to another substrate for the fabrication of various electrical devices. PMMA-mediated wet process is the most widely used method for CVD-graphene-transfer. However, PMMA residue and wrinkles that inevitably remain on the graphene surface during the transfer process are critical issues degrading the electrical properties of graphene. In this paper, we report on a PMMA-mediated graphene-transfer method that can effectively reduce the density and size of the PMMA residue and the height of wrinkles on the transferred graphene layer. We found out that acetic acid is the most effective PMMA stripper among the typically used solutions to remove the PMMA residue. In addition, we observed that an optimized annealing process can reduce the height of the wrinkles on the transferred graphene layer without degrading the graphene quality. The effects of the suggested wet transfer process were also investigated by evaluating the electrical properties of field-effect transistors fabricated on the transferred graphene layer. The results of this work will contribute to the development of fabrication processes for high-quality graphene devices, given that the transfer of graphene from the Cu substrate is essential process to the application of CVD-graphene.