• 文献标题:   Transmission Electron Microscopy and Raman-Scattering Spectroscopy Observation on the Interface Structure of Graphene Formed on Si Substrates with Various Orientations
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   HANDA H, TAKAHASHI R, ABE S, IMAIZUMI K, SAITO E, JUNG MH, ITO S, FUKIDOME H, SUEMITSU M
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922
  • 通讯作者地址:   Tohoku Univ
  • 被引频次:   18
  • DOI:   10.1143/JJAP.50.04DH02
  • 出版年:   2011

▎ 摘  要

Graphene can be grown on three major low-index substrates of Si(111), (110), and (001) by forming a 3C-SiC thin film and by subliming Si atoms from the top few layers of the SiC film. We have investigated the structure of graphene/3C-SiC interface by cross-sectional transmission electron microscopy (XTEM) and Raman-scattering spectroscopy. While the interface layer quite similar to that on the graphene/6H-SiC(0001) face is found to exist on the 3C-SiC(111)/Si(111) substrate, no such interface structure exists on the (110)- and (001)-oriented faces. (C) 2011 The Japan Society of Applied Physics