• 文献标题:   Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene
  • 文献类型:   Article
  • 作  者:   WU JQ, ZHANG Y, WANG B, YI FT, DENG SZ, XU NS, CHEN J
  • 作者关键词:   fewlayer graphene, xray irradiation, field emission
  • 出版物名称:   NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION BBEAM INTERACTIONS WITH MATERIALS ATOMS
  • ISSN:   0168-583X EI 1872-9584
  • 通讯作者地址:   Sun Yat Sen Univ
  • 被引频次:   8
  • DOI:   10.1016/j.nimb.2013.04.041
  • 出版年:   2013

▎ 摘  要

Vertically aligned few-layer graphene is prepared using microwave plasma enhanced chemical vapor deposition. The vertically aligned few-layer graphene is irradiated by X-ray of different doses from synchrotron radiation. The main structure of vertically aligned few-layer graphene is found to remain unchanged after X-ray irradiation both in high and low vacuum. X-ray photoelectron spectroscopy results reveal that the oxygen content in pristine and irradiated few-layer graphene remain unchanged after X-ray irradiation in high vacuum. When irradiated in low vacuum, the oxygen content in few-layer graphene increases with X-ray dose. For the vertically aligned few-layer graphene irradiated in low vacuum, the work function first increases and then slightly decreases with further increase irradiation dose from 9.0 x 10(14) to 3.6 x 10(15) phs/cm(2). The field electron emission turn-on field is observed to increase from 4.0 to 9.1 MV/m after X-ray irradiation with the dose of 3.6 x 10(15) phs/cm(2). The mechanism of the changes in work function and field emission performance of vertically aligned few-layer graphene after X-ray irradiation in low vacuum are discussed. (C) 2013 Elsevier B.V. All rights reserved.