▎ 摘　　要

While technologically important to maintain porosity, a noninvasive improvement and testing of electrical conductivity of metal-organic frameworks (MOFs), and their composites, are challenging due to their insulating and fragile nature. A conducting atomic force microscope (C-AFM) was utilized to probe the conductivity of self-assembled MOF on graphene (UiO-66-NH2@G) and compared with conventional 4-point probe method. C-AFM gives 11.8 Sm-1 for the conductivity on a single grain, while an average value of 6.6 x 10(-4) Sm-1 was recorded utilizing the 4-point probe method. The dramatic enhancement of conductivity for the MOF@G composite can be ascribed to delocalization of interfacial states between MOF and graphene. Concurrently, gas sorption, X-ray and FTIR analysis reveal no changes in the overall porosity and the structure of the MOF materials. The combination of bottom up synthesis and testing provides guidelines to enhance conductivity and understand the mechanism of charge transport in otherwise insulating MOF materials. (C) 2019 Published by Elsevier B.V.