• 文献标题:   Imaging coherent transport in chemical vapor deposition graphene wide constriction by scanning gate microscopy
  • 文献类型:   Article
  • 作  者:   CHUANG C, MATSUNAGA M, LIU FH, WOO TP, LIN LH, OTO K, OCHIAI Y, LIANG CT, AOKI N
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Chiba Univ
  • 被引频次:   3
  • DOI:   10.1063/1.4944637
  • 出版年:   2016

▎ 摘  要

We use a scanning gate microscopy to perturb coherent transport in chemical vapor deposition (CVD) graphene wide constriction. Particularly, we observe conductance oscillations in the wide constriction region (W similar to 800 nm) characterized by spatial conductance variations, which imply formation of the nanometer-scale ring structure due to the merged domains and intrinsic grain boundaries. Moreover, additional hot charges from high current can suppress the coherent transport, suggesting that the hot carriers with a wide spreading kinetic energy could easily tunnel merged domains and intrinsic grain boundaries in CVD-grown graphene due to the heating effect, a great advantage for applications in graphene-based interference-type nano-electronics. (C) 2016 AIP Publishing LLC.