• 文献标题:   STM visualization of carbon impurities in sandwich structures consisting of hexagonal boron nitride and graphene
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   HAGA T, FUJIMOTO Y, SAITO S
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:   Tokyo Inst Technol
  • 被引频次:   0
  • DOI:   10.7567/1347-4065/ab0ff8
  • 出版年:   2019

▎ 摘  要

We study the electronic structures and scanning tunneling microscopy (STM) images of heterostructures consisting of pristine h-BN, graphene, and C-doped h-BN layers using first-principles total-energy calculations within the framework of the density functional theory. We find that substitutional doping of a C atom at B and N sites in the h-BN layer induces the different charge carrier types and asymmetric carrier densities on the graphene layer. We also find that C-atom impurity state can be clearly observed in the STM image when a C atom is doped at the N site in the h-BN layer. We discuss the relationship between the STM images and the spatial distribution of the C-induced impurity state. (C) 2019 The Japan Society of Applied Physics