• 文献标题:   Gate-controlled ultraviolet photo-etching of graphene edges
  • 文献类型:   Article
  • 作  者:   MITOMA N, NOUCHI R
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Osaka Prefecture Univ
  • 被引频次:   7
  • DOI:   10.1063/1.4830226
  • 出版年:   2013

▎ 摘  要

The chemical reactivity of graphene under ultraviolet (UV) light irradiation is investigated under positive and negative gate electric fields. Graphene edges are selectively etched when negative gate voltages are applied while the reactivity is significantly suppressed for positive gate voltages. Oxygen adsorption onto graphene is significantly affected by the Fermi level of the final state achieved during previous electrical measurements. UV irradiation after negative-to-positive gate sweeps causes predominant oxygen desorption while UV irradiation after gate sweeps in the opposite direction causes etching of graphene edges. (C) 2013 AIP Publishing LLC.