• 文献标题:   Direct Imaging of a Two-Dimensional Silica Glass on Graphene
  • 文献类型:   Article
  • 作  者:   HUANG PY, KURASCH S, SRIVASTAVA A, SKAKALOVA V, KOTAKOSKI J, KRASHENINNIKOV AV, HOVDEN R, MAO QY, MEYER JC, SMET J, MULLER DA, KAISER U
  • 作者关键词:   twodimensional glas, 2d silica, sio2, transmission electron microscopy, graphene imaging substrate, zachariasen s model
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Ulm
  • 被引频次:   148
  • DOI:   10.1021/nl204423x
  • 出版年:   2012

▎ 摘  要

Large-area graphene substrates provide a promising lab bench for synthesizing, manipulating, and characterizing low-dimensional materials, opening the door to high-resolution analyses of novel structures, such as two-dimensional (2D) glasses, that cannot be exfoliated and may not occur naturally. Here, we report the accidental discovery of a 2D silica glass supported on graphene. The 2D nature of this material enables the first atomic resolution transmission electron microscopy of a glass, producing images that strikingly resemble Zachariasen's original 1932 cartoon models of 2D continuous random network glasses. Atomic-resolution electron spectroscopy identifies the glass as SiO2 formed from a bilayer of (SiO4)(2-) tetrahedra and without detectable covalent bonding to the graphene. From these images, we directly obtain ring statistics and pair distribution functions that span short-, medium-, and long-range order. Ab initio calculations indicate that van der Waals interactions with graphene energetically stabilizes the 2D structure with respect to bulk SiO2. These results demonstrate a new class of 2D glasses that can be applied in layered graphene devices and studied at the atomic scale.