• 文献标题:   The growth and morphology of epitaxial multilayer graphene
  • 文献类型:   Review
  • 作  者:   HASS J, DE HEER WA, CONRAD EH
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF PHYSICSCONDENSED MATTER
  • ISSN:   0953-8984 EI 1361-648X
  • 通讯作者地址:   Georgia Inst Technol
  • 被引频次:   583
  • DOI:   10.1088/0953-8984/20/32/323202
  • 出版年:   2008

▎ 摘  要

The electronic properties of epitaxial graphene grown on SiC have shown its potential as a viable candidate for post-CMOS electronics. However, progress in this field requires a detailed understanding of both the structure and growth of epitaxial graphene. To that end, this review will focus on the current state of epitaxial graphene research as it relates to the structure of graphene grown on SiC. We pay particular attention to the similarity and differences between graphene growth on the two polar faces, (0001) and (000 (1) over bar), of hexagonal SiC. Growth techniques, subsequent morphology and the structure of the graphene/SiC interface and graphene stacking order are reviewed and discussed. Where possible the relationship between film morphology and electronic properties will also be reviewed.