• 文献标题:   Determination of Carrier Type Doped from Metal Contacts to Graphene by Channel-Length-Dependent Shift of Charge Neutrality Points
  • 文献类型:   Article
  • 作  者:   NOUCHI R, SAITO T, TANIGAKI K
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS EXPRESS
  • ISSN:   1882-0778
  • 通讯作者地址:   Tohoku Univ
  • 被引频次:   22
  • DOI:   10.1143/APEX.4.035101
  • 出版年:   2011

▎ 摘  要

A method for determining the type of charge carrier, electron or hole, which is transferred from metal contacts to graphene, is described. The Dirac point is found to shift toward more negative (positive) gate voltages for electron (hole) doping by shortening of the interelectrode spacing. The shift of the Dirac point is accompanied by an enhancement of the electron-hole conductivity asymmetry. Experimentally determined carrier types may be explained in terms of the metal work functions modified by interactions with graphene. (C) 2011 The Japan Society of Applied Physics