▎ 摘　　要

We report on arrangement of iron oxide nanoparticles deposited on flat substrate, on and below graphene, respectively. We combined grazing incidence small angle X-ray scattering (GISAXS) and atomic force microscopy (AFM) to obtain the mean size of the particles and the mean inter-particle distance. While GISAXS provides statistically relevant information averaged over large area, AFM serves to support and clarify the results of GISAXS observations by inspection of the representative area of the sample. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim