• 文献标题:   Fabry-Perot Interference in Gapped Bilayer Graphene with Broken Anti-Klein Tunneling
  • 文献类型:   Article
  • 作  者:   VARLET A, LIU MH, KRUECKL V, BISCHOFF D, SIMONET P, WATANABE K, TANIGUCHI T, RICHTER K, ENSSLIN K, IHN T
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW LETTERS
  • ISSN:   0031-9007 EI 1079-7114
  • 通讯作者地址:   ETH
  • 被引频次:   40
  • DOI:   10.1103/PhysRevLett.113.116601
  • 出版年:   2014

▎ 摘  要

We report the experimental observation of Fabry-Perot interference in the conductance of a gate-defined cavity in a dual-gated bilayer graphene device. The high quality of the bilayer graphene flake, combined with the device's electrical robustness provided by the encapsulation between two hexagonal boron nitride layers, allows us to observe ballistic phase-coherent transport through a 1-mu m-long cavity. We confirm the origin of the observed interference pattern by comparing to tight-binding calculations accounting for the gate-tunable band gap. The good agreement between experiment and theory, free of tuning parameters, further verifies that a gap opens in our device. The gap is shown to destroy the perfect reflection for electrons traversing the barrier with normal incidence (anti-Klein tunneling). The broken anti-Klein tunneling implies that the Berry phase, which is found to vary with the gate voltages, is always involved in the Fabry-P rot oscillations regardless of the magnetic field, in sharp contrast with single-layer graphene.