• 文献标题:   Direct probing of density of states of reduced graphene oxides in a wide voltage range by tunneling junction
  • 文献类型:   Article
  • 作  者:   WANG ST, LIN YF, LI YC, YEH PC, TANG SJ, ROSENSTEIN B, HSU TH, ZHOU XF, LIU ZP, LIN MT, JIAN WB
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Natl Chino Tung Univ
  • 被引频次:   3
  • DOI:   10.1063/1.4765361
  • 出版年:   2012

▎ 摘  要

Reduced graphene oxide (rGO) sheets are synthesized and tunneling junction devices are fabricated with an aluminum oxide layer inserted in between electrodes and rGO sheets. Differential conductances, revealing density of states (DOS), of rGO sheets are measured in a wide voltage range. A difference in DOS of rGO sheets with different thickness is identified. For the single-layer rGO, the DOS shows a whole band with band edges in line with theoretical predictions, and gating DOS is used to estimate electron's Fermi velocity. Disorder effects on conductance and DOS of rGO sheets are explored and compared with each other. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4765361]