• 文献标题:   Scanning Tunneling Microscopy investigation of the graphene/6H-SiC(000(1)over-bar) (3 x 3) interface
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   HIEBEL F, MALLET P, VARCHON F, MAGAUD L, VEUILLEN JY
  • 作者关键词:   surfaces interface, crystal growth, scanning tunneling microscopy
  • 出版物名称:   SOLID STATE COMMUNICATIONS
  • ISSN:   0038-1098 EI 1879-2766
  • 通讯作者地址:   CNRS
  • 被引频次:   4
  • DOI:   10.1016/j.ssc.2009.02.047
  • 出版年:   2009

▎ 摘  要

The early stages of the graphitization of the 6H-SiC(000 (1) over bar) (3 x 3) surface in an Ultra-High Vacuum (UHV) are investigated by means of scanning tunneling microscopy (STM). Different kinds of graphitic islands are found on the surface. One kind (called G_3 x 3) consists of a single graphene-like carbon plane covering the initial (3 x 3) reconstructed substrate surface. We observe a broad distribution of rotation angles between the substrate and the carbon plane revealed by superstructures of different directions and periods. Low bias images show that the graphene structure is preserved close to the Fermi level. The data indicate a weak substrate-graphene coupling for the G_3 x 3 islands. (C) 2009 Elsevier Ltd. All rights reserved.