• 文献标题:   Analysis and suppression of drain current drift in graphene FETs
  • 文献类型:   Article
  • 作  者:   PARK JM, LEE D, SHIM J, JEON T, EOM K, PARK BG, LEE JH
  • 作者关键词:   drain current drift, dirac point, graphene fet, hysteresi, pulsed iv
  • 出版物名称:   SEMICONDUCTOR SCIENCE TECHNOLOGY
  • ISSN:   0268-1242 EI 1361-6641
  • 通讯作者地址:   Seoul Natl Univ
  • 被引频次:   2
  • DOI:   10.1088/0268-1242/30/10/105013
  • 出版年:   2015

▎ 摘  要

The cause of drain current (I-D) drift in graphene field-effect transistors is analyzed and a method to suppress the drift is proposed. By analyzing I-D-time characteristics, a condition of reasonable gate, drain and source biases (V-G, V-D, and V-S) is proposed to suppress I-D drift. Based on this result, we find a condition for V-G during off-time (V-base), V-D, and V-S in pulsed I-V measurement to obtain the intrinsic I-D-V-G curves, and analyze the effect of V-base on the Dirac point shift. Through an analysis of I-D-time characteristics depending on V-G, I-D drift according to the range of V-G is explained.