• 文献标题:   Enhancing Hysteresis in Graphene Devices Using Dielectric Screening
  • 文献类型:   Article
  • 作  者:   BRENNER K, BECK TJ, MEINDL JD
  • 作者关键词:   chargedimpurity scattering, dielectric screening, graphene, graphene device, hysteresi, memory
  • 出版物名称:   IEEE ELECTRON DEVICE LETTERS
  • ISSN:   0741-3106
  • 通讯作者地址:   Georgia Inst Technol
  • 被引频次:   2
  • DOI:   10.1109/LED.2012.2200650
  • 出版年:   2012

▎ 摘  要

A method of increasing hysteresis in graphene devices with a dielectric coating is presented. By controlling the sweep direction of the gate bias, "high-conductance" and "low-conductance" states can be produced by transitioning the device between dielectric screened and unscreened states, which is a fundamentally new approach to producing hysteresis. Moderate carrier densities (similar to 4 x 10(12) cm(-2)) result in field-driven injection of charge from the graphene channel into the underlying SiO2 substrate, modifying the scattering charged-impurity layout seen by the graphene, ultimately disrupting the steady-state screening process. A stable room-temperature conductance gap of nearly one order of magnitude is demonstrated.