• 文献标题:   SPECTROSCOPIC ELLIPSOMETRY STUDIES OF PHOSPHORUS OXIDE INFLUENCE ON GRAPHENE-ZnO SOL-GEL COMPOSITE FILMS OPTICAL PROPERTIES
  • 文献类型:   Article
  • 作  者:   BASCHIR L, SAVASTRU D, POPESCU AA, VASILIU IC, ELISA M, CHILIBON I, OBREJA C
  • 作者关键词:   solgel, thin film, graphene, spectroscopic ellipsometry, optical propertie
  • 出版物名称:   DIGEST JOURNAL OF NANOMATERIALS BIOSTRUCTURES
  • ISSN:   1842-3582
  • 通讯作者地址:   Natl Inst Res Dev Optoelect INOE 2000
  • 被引频次:   1
  • DOI:  
  • 出版年:   2018

▎ 摘  要

Composite materials of zinc oxide (ZnO) and graphene oxide (GO) have caused emergence of potential application in the field of optoelectronics. Phosphate based glasses (P2O5) can improve the conductivity and increase the graphene oxide (GO) concentration and homogeneity distribution in the films This paper presents a comparative study of two types of composite thin films. ZnO/P2O5/GO and ZnO/GO deposited through a sol-gel process on glass substrates. Optical analysis derived from spectroscopic ellipsometry was involved calculating the reflectance spectral curves for different thicknesses of the thin film layers constituting the ZnO/P2O5/GO and ZnO/GO.