• 文献标题:   Structural evaluation of reduced graphene oxide in graphene oxide during ion irradiation: X-ray absorption spectroscopy and in-situ sheet resistance studies
  • 文献类型:   Article
  • 作  者:   SARAVANAN K, JAYALAKSHMI G, SURESH K, SUNDARAVEL B, PANIGRAHI BK, PHASE DM
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Indira Gandhi Ctr Atom Res
  • 被引频次:   5
  • DOI:   10.1063/1.5025097
  • 出版年:   2018

▎ 摘  要

We report the structural evolution of reduced graphene oxide (rGO) in graphene oxide (GO) flakes during 1MeV Si+ ion irradiation. In-situ electrical resistivity measurements facilitate monitoring the sheet resistance with the increase in the fluence. The electrical sheet resistance of the GO flake shows the exponential decay behaviour with the increasing ion fluence. Raman spectra of the GO flake reveal the increase in the I-D/I-G ratio, indicating restoration of the sp(2) network upon irradiation. The C/O ratio estimated from resonant Rutherford backscattering spectrometry analysis directly evidenced the reduction of oxygen moieties upon irradiation. C K-edge X-ray absorption near edge structure spectra reveal the restoration of C=C sp(2)-hybridized carbon atoms and the removal of oxygen-containing functional groups in the GO flake. STM data reveal the higher conductance in the rGO regime in comparison with the regime, where the oxygen functional groups are present. The experimental investigation demonstrates that the ion irradiation can be employed for efficient reduction of GO with tunable electrical and structural properties. Published by AIP Publishing.