• 文献标题:   Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison
  • 文献类型:   Article
  • 作  者:   BU TJ, GAO HF, YAO YX, WANG JF, POLLARD AJ, LEGGE EJ, CLIFFORD CA, DELVALLEE A, DUCOURTIEUX S, LAWN MA, BABIC B, COLEMAN VA, JAMTING A, ZOU S, CHEN MH, JAKUBEK ZJ, IACOB E, CHANTHAWONG N, MONGKOLSUTTIRAT K, ZENG GH, ALMEIDA CM, HE BC, HYDE L, REN LL
  • 作者关键词:   graphene oxide, atomic force microscopy afm, thicknes, histogram method, interlaboratory comparison, uncertainty evaluation
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.1088/1361-6528/acbf58
  • 出版年:   2023

▎ 摘  要

Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards. Twelve laboratories participated in the comparison project, led by NIM, China, to improve the equivalence of thickness measurement for two-dimensional flakes. The measurement methods, uncertainty evaluation and a comparison of the results and analysis are reported in this manuscript. The data and results of this project will be directly used to support the development of an ISO standard.