• 文献标题:   Analysis of atomic Moire patterns on graphene/Rh(111)
  • 文献类型:   Article
  • 作  者:   HOLTSCH A, EUWENS T, UDER B, GRANDTHYLL S, MULLER F, HARTMANN U
  • 作者关键词:   graphene, moire pattern, scanning tunneling spectroscopy, low energy electron diffraction, xray photoelectron spectroscopy
  • 出版物名称:   SURFACE SCIENCE
  • ISSN:   0039-6028 EI 1879-2758
  • 通讯作者地址:   Saarland Univ
  • 被引频次:   1
  • DOI:   10.1016/j.susc.2017.10.026
  • 出版年:   2018

▎ 摘  要

In scanning tunneling microscopy the lattice mismatch between graphene and Rh(111) is observed as an additional superstructure. This superstructure is called Moire pattern. Various symmetry sites occur in a Moire pattern. These are distinguished by the arrangement of the graphene lattice over the Rh(111) lattice. The symmetry sites of the Moire unit cell are investigated by scanning tunneling microscopy and spectroscopy. The observed additional corrugation of the graphene sheet within a Moire cell is the consequence of strain and electronic interactions between graphene and the Rh(111) substrate. The lattice period of the Moire pattern depends on the in-plane rotation angle of the graphene layer with respect to the Rh(111) substrate. Scanning tunneling spectroscopy reveals a dependency of the local density of states on the hybridization of the pi orbitals of the graphene with the d band of Rh(111). This results in a characteristic spectroscopic fingerprints of the individual symmetry sites of the Moire pattern. (C) 2017 Elsevier B.V. All rights reserved.