• 文献标题:   An embedded gate graphene field effect transistor with natural Al oxidization dielectrics and its application to frequency doubler
  • 文献类型:   Article
  • 作  者:   ZENG RZ, LI P, WANG YW, WANG G, ZHANG QW, LIAO YB, XIE XD
  • 作者关键词:   embedded gate, graphene field effect transistor, natural al oxidization dielectric, frequency doubler, high efficiency
  • 出版物名称:   IEICE ELECTRONICS EXPRESS
  • ISSN:   1349-2543
  • 通讯作者地址:   Univ Elect Sci Technol China
  • 被引频次:   1
  • DOI:   10.1587/elex.14.20170707
  • 出版年:   2017

▎ 摘  要

A high efficiency frequency doubler is realized based on a single embedded gate (EG) graphene field effect transistor (GFET) with natural Al oxidation dielectrics. Due to elimination of the step of depositing gate dielectrics, the fabrication process of the EG-GFET is improved compared to conventional EG-GFETs. The capacitive efficiency of the EG-GFET is improved up to 80 times compared to the conventional silicon back gate (BG) GFET with 300nm thick SiO2, which is higher than that of most conventional EG-GFETs. Thanks to the high capacitive efficiency, the conversion gain of the frequency doubler is 14 times higher than that of the BG-GFET based frequency doubler.