• 文献标题:   STM/S observations of graphene on SiC(0001) etched by H-plasma
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   AMEND AEB, MATSUI T, HIBINO H, FUKUYAMA H
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:   Univ Tokyo
  • 被引频次:   0
  • DOI:   10.7567/1347-4065/ab1b5d
  • 出版年:   2019

▎ 摘  要

Monolayer graphene epitaxially grown on SiC(0001) was etched by H-plasma and studied by scanning tunneling microscopy and spectroscopy. The etching created partly hexagonal nanopits of monatomic depth as well as elevated regions with a height of about 0.12 nm which are stable at T = 78 K. The symmetric tunnel spectrum about the Fermi energy and the absence of a 6 x 6 corrugation on the elevated regions suggest that in these regions the carbon buffer layer is decoupled from the SiC substrate and quasi-free-standing bilayer graphene appears at the originally monolayer graphene on the buffer layer. This is a result of passivation of the SiC substrate by intercalated hydrogen as in previous reports for graphene on SiC(0001) heat treated in atomic hydrogen. (C) 2019 The Japan Society of Applied Physics