• 文献标题:   Phonon and Structural Changes in Deformed Bernal Stacked Bilayer Graphene
  • 文献类型:   Article
  • 作  者:   FRANK O, BOUSA M, RIAZ I, JALIL R, NOVOSELOV KS, TSOUKLERI G, PARTHENIOS J, KAVAN L, PAPAGELIS K, GALIOTIS C
  • 作者关键词:   bilayer graphene, raman spectroscopy, strain, tension, band gap
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   AS CR
  • 被引频次:   45
  • DOI:   10.1021/nl203565p
  • 出版年:   2012

▎ 摘  要

We present the first Raman spectroscopic study of Bernal bilayer graphene flakes under uniaxial tension. Apart from a purely mechanical behavior in flake regions where both layers are strained evenly, certain effects stem from inhomogeneous stress distribution across the layers. These phenomena such as the removal of inversion symmetry in bilayer graphene may have important implications in the band gap engineering, providing an alternative route to induce the formation of a band gap.