▎ 摘　　要

We report a technique to characterize adhesion of monolayered/multilayered graphene sheets on silicon wafer. Nanoparticles trapped at graphene-silicon interface act as point wedges to support axisymmetric blisters. Local adhesion strength is found by measuring the particle height and blister radius using a scanning electron microscope. Adhesion energy of the typical graphene-silicon interface is measured to be 151 +/- 28 mJ/m(2). The proposed method and our measurements provide insights in fabrication and reliability of microelectromechanical/nanoelectromechanical systems.