• 文献标题:   Edge chirality determination of graphene by Raman spectroscopy
  • 文献类型:   Article
  • 作  者:   YOU YM, NI ZH, YU T, SHEN ZX
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Nanyang Technol Univ
  • 被引频次:   165
  • DOI:   10.1063/1.3005599
  • 出版年:   2008

▎ 摘  要

Raman imaging of single layer micromechanical cleavage graphene was carried out. The intensity of disorder-induced Raman feature (D band at similar to 1350 cm(-1)) was found to be correlated to the edge chirality: it is stronger at the armchair edge and weaker at the zigzag edge. This shows that Raman spectroscopy is a reliable and practical method to identify the chirality of graphene edge and hence the crystal orientation. The determination of graphene chirality is critically important for fundamental study of graphene as well as applications of graphene-based devices. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3005599].