• 文献标题:   Selective Epitaxy of InP on Si and Rectification in Graphene/InP/Si Hybrid Structure
  • 文献类型:   Article
  • 作  者:   NIU G, CAPELLINI G, HATAMI F, DI BARTOLOMEO A, NIERMANN T, HUSSEIN EH, SCHUBERT MA, KRAUSE HM, ZAUMSEIL P, SKIBITZKI O, LUPINA G, MASSELINK WT, LEHMANN M, XIE YH, SCHROEDER T
  • 作者关键词:   nanoheteroepitaxy, monolithic integration, iiiv compound, graphene, rectification
  • 出版物名称:   ACS APPLIED MATERIALS INTERFACES
  • ISSN:   1944-8244
  • 通讯作者地址:   Xi An Jiao Tong Univ
  • 被引频次:   9
  • DOI:   10.1021/acsami.6b09592
  • 出版年:   2016

▎ 摘  要

The epitaxial integration of highly heterogeneous material systems with silicon (Si) is a central topic in (opto-)electronics owing to device applications. InP could open new avenues for the realization of novel devices such as high-mobility transistors in next-generation CMOS or efficient lasers in Si photonics circuitry. However, the InP/Si heteroepitaxy is highly challenging due to the lattice (similar to 8%), thermal expansion mismatch (similar to 84%), and the different lattice symmetries. Here, we demonstrate the growth of InP nanocrystals showing high structural quality and excellent optoelectronic properties on Si. Our CMOS-compatible innovative approach exploits the selective epitaxy of InP nanocrystals on Si nanometric seeds obtained by the opening of lattice-arranged Si nanotips embedded in a SiO2 matrix. A graphene/InP/Si-tip heterostructure was realized on obtained materials, revealing rectifying behavior and promising photodetection. This work presents a significant advance toward the monolithic integration of graphene/III-V based hybrid devices onto the mainstream Si technology platform.