• 文献标题:   Two-Step Mechanism for Low-Temperature Oxidation of Vacancies in Graphene
  • 文献类型:   Article
  • 作  者:   CARLSSON JM, HANKE F, LINIC S, SCHEFFLER M
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW LETTERS
  • ISSN:   0031-9007 EI 1079-7114
  • 通讯作者地址:   Max Planck Gesell
  • 被引频次:   92
  • DOI:   10.1103/PhysRevLett.102.166104
  • 出版年:   2009

▎ 摘  要

We study the oxidation of vacancies in graphene by ab initio atomistic thermodynamics to identify the dominant reaction mechanisms. Our calculations show that the low-temperature oxidation occurs via a two-step process: Vacancies are initially saturated by stable O groups, such as ether (C-O-C) and carbonyl (C=O). The etching is activated by a second step of additional O-2 adsorption at the ether groups, forming larger O groups, such as lactone (C-O-C=O) and anhydride (O=C-O-C=O), that may desorb as CO2 just above room temperature. Our studies show that the partial pressure of oxygen is an important external parameter that affects the mechanisms of oxidation and that allows us to control the extent of etching.