• 文献标题:   Insight into the mechanical integrity of few-layers graphene upon lithiation/delithiation via in situ monitoring of stress development
  • 文献类型:   Article
  • 作  者:   SONIA FJ, ANANTHOJU B, JANGID MK, KALI R, ASLAM M, MUKHOPADHYAY A
  • 作者关键词:  
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:   Indian Inst Technol
  • 被引频次:   16
  • DOI:   10.1016/j.carbon.2015.02.078
  • 出版年:   2015

▎ 摘  要

By monitoring the stress developments in situ during lithiation/delithiation of few layers graphene films, we report here for the first time an interesting observation of stress release/reversal just within the potential ranges corresponding to the co-existences of pristine graphene, dilute stage I and stage IV Li-graphite intercalation compounds (Li-GICs). This, along with supporting observations related to the presence of cracks in the graphene films upon electrochemical cycling and enhanced I-D/I-G ratio in Raman spectra recorded upon cycling primarily within the potential regimes corresponding to the stress release/reversal, indicate possible occurrences of mechanical/structural degradation mainly during the initial stages of lithiation and later stages of delithiation. This observation is being supported by a geometric model which estimates the strains induced in the individual graphene layers at the interfaces between the different Li-GICs at the various stages of lithia don; and as a function of distance from the current collector. On a slightly different note, the experimentally recorded magnitude of net lithiation induced reversible in-plane stress development was similar to 11 GPa. This is in fair agreement with that expected based on the theoretical dilation of similar to 1% along the graphene layers upon lithiation as per the classical Li-intercalation mechanism (i.e., up to formation of LiC6). (c) 2015 Elsevier Ltd. All rights reserved.