• 文献标题:   Graphene/SrTiO3 hetero interface studied by X-ray photoelectron spectroscopy
  • 文献类型:   Article
  • 作  者:   KARAMAT S, KE C, INKAYA UY, AKRAM R, YILDIZ I, ZAMAN SS, ORAL A
  • 作者关键词:   chemical vapour deposition, xray photoelectron spectroscopy, raman spectroscopy, graphene, valence band maximum
  • 出版物名称:   PROGRESS IN NATURAL SCIENCEMATERIALS INTERNATIONAL
  • ISSN:   1002-0071 EI 1745-5391
  • 通讯作者地址:   Middle East Tech Univ
  • 被引频次:   5
  • DOI:   10.1016/j.pnsc.2016.06.010
  • 出版年:   2016

▎ 摘  要

The present paper focuses on study of graphene and strontium titanate (SrTiO3 or STO) interface. An ambient pressure chemical vapour deposition (AP-CVD) setup is used to grow graphene on STO (110) substrates in the presence of methane, argon and hydrogen gases at 1000 degrees C for 4 h. Raman spectroscopy measurements confirm the presence of graphene on STO substrates due to the existence of typical D and G peaks referring to graphene. These characteristic peaks are missing in the spectrum for bare substrates. X-ray photoelectron spectroscopy (XPS) is carried out for elemental analysis of samples, and study their bonding with STO substrates. We employed the valence band spectrum to calculate the valence band offset (VBO) and conduction band offset (CBO) at the G-STO interface. Also, we present an energy band diagram for Bi-layer and ABC (arranging pattern of carbon layers) stacked graphene layers. (C) 2016 Chinese Materials Research Society. Production and hosting by Elsevier B.V.