• 文献标题:   Enhanced Photoresponse in Interfacial Gated Graphene Phototransistor With Ultrathin Al2O3 Dielectric
  • 文献类型:   Article
  • 作  者:   TAO L, LI H, SUN MX, XIE D, LI XM, XU JB
  • 作者关键词:   graphene, photodetector, interfacial gating, depletion capacitance
  • 出版物名称:   IEEE ELECTRON DEVICE LETTERS
  • ISSN:   0741-3106 EI 1558-0563
  • 通讯作者地址:   Chinese Univ Hong Kong
  • 被引频次:   2
  • DOI:   10.1109/LED.2018.2843804
  • 出版年:   2018

▎ 摘  要

An interfacial-gated graphene phototransistor sensitized by silicon substrate with an ultrathin 3-nm Al2O3 dielectric layer is demonstrated. When applying gate voltages larger than a certain threshold, the phototransistor exhibits a photo-induced switching-on behavior, giving rise to its capacity of detecting light with the ultralow power of 470 pW, with a high responsivity of 1.4 x 10(4) A/W. The temporal measurements unveil a fast photoresponse speed with a rising time of 2 mu s. The novel channel on-state trigged by light was not observed in a control device with 16-nm Al2O3. The difference of transfer characteristics in the dark and under illumination is assigned mainly to the photo-assistedmodification of the silicon depletion region.