• 文献标题:   Dissipative transport in rough edge graphene nanoribbon tunnel transistors
  • 文献类型:   Article
  • 作  者:   YOON Y, SALAHUDDIN S
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Univ Calif Berkeley
  • 被引频次:   18
  • DOI:   10.1063/1.4772532
  • 出版年:   2012

▎ 摘  要

We have studied quantum transport in graphene nanoribbon tunnel field-effect transistors. Unlike other studies on similar structures, we have included dissipative processes induced by inelastic electron-phonon scattering and edge roughness in the nanoribbon self-consistently within a non-equilibrium transport simulation. Our results show that the dissipative scattering imposes a limit to the minimum OFF current and a minimum subthreshold swing that can be obtained even for long channel lengths where direct source-drain tunneling is inhibited. The edge roughness, in the presence of dissipative scattering, somewhat surprisingly, shows a classical behavior where it mostly reduces the maximum ON current achievable in this structure. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4772532]