• 文献标题:   Radio-frequency transport Electromagnetic Properties of chemical vapour deposition graphene from direct current to 110 MHz
  • 文献类型:   Article
  • 作  者:   AWAN SA, PAN GH, AL TAAN LM, LI B, JAMIL N
  • 作者关键词:   graphene, chemical vapour deposition, frequency response, lumped parameter network, equivalent circuit, electric resistance, nanoelectronic, radiofrequency integrated circuit, csisio2, frequency 40 hz, temperature 293 k to 298 k, ac quantum hall effect metrology, rf electronic, singleatom thick material, intrinsic sheet resistance, intrinsic graphene channel resistance, frequency response, lumpedparameter equivalent circuit model, substrate parasitic capacitance, dc fourprobe resistance, four terminalpair adaptor, graphene, chemical vapour deposition, electromagnetic propertie, radiofrequency transport
  • 出版物名称:   IET CIRCUITS DEVICES SYSTEMS
  • ISSN:   1751-858X EI 1751-8598
  • 通讯作者地址:   Univ Plymouth
  • 被引频次:   2
  • DOI:   10.1049/iet-cds.2014.0204
  • 出版年:   2015

▎ 摘  要

The authors report measurement of the radio-frequency (RF) transport electromagnetic properties of chemical vapour deposition graphene over the direct current (DC) to 110 MHz frequency range at room temperature. Graphene on Si/SiO2 substrate was mounted in a shielded four terminal-pair (4TP) adaptor which enabled direct connection to a calibrated precision impedance analyser for measurements. Good agreement is observed for the DC four-probe resistance and the 4TP resistance at 40 Hz, both yielding R approximate to 104 . In general, the apparent graphene channel electromagnetic properties are found to be strongly influenced by the substrate parasitic capacitance and resistance, particularly for high-frequencies f > 1 MHz. A phenomenological lumped-parameter equivalent circuit model is presented which matches the frequency response of the graphene 4TP impedance device over approximately seven decades of the frequency range of the applied transport alternating current. Based on this model, it is shown for the first time, that the intrinsic graphene channel resistance of the 4TP device is frequency-independent' with R-G similar or equal to 105 or sheet resistance of approximately 182 /. The parasitic substrate impedance of the device is found to be R-P similar or equal to 2.2 and C-P similar or equal to 600 pF. These results suggest that our new RF 4TP method is in good agreement with the conventional DC four-probe method for measuring the intrinsic sheet resistance of single-atom thick materials and could potentially open up new applications in RF electronics, AC quantum Hall effect metrology and sensors based on graphene 4TP devices operating over a broad range of frequencies.