• 文献标题:   Atomic scale characterization of mismatched graphene layers
  • 文献类型:   Article
  • 作  者:   LUICANMAYER A, LI GH, ANDREI EY
  • 作者关键词:   graphene, interlayer coupling, scanning tunneling microscopy
  • 出版物名称:   JOURNAL OF ELECTRON SPECTROSCOPY RELATED PHENOMENA
  • ISSN:   0368-2048 EI 1873-2526
  • 通讯作者地址:   Univ Ottawa
  • 被引频次:   3
  • DOI:   10.1016/j.elspec.2017.01.005
  • 出版年:   2017

▎ 摘  要

In the bourgeoning field of two dimensional layered materials and their atomically thin counterparts, it has been established that the electronic coupling between the layers of the material plays a key role in determining its properties [1,2]. We are just beginning to understand how each material is unique in that respect while working our way up to building new materials with functionalities enabled by interlayer interactions. In this review, we will focus on a system that despite its apparent simplicity possesses a wealth of intriguing physics: layers of graphene with various degree of coupling. The situations discussed here are graphene layers vertically twisted with respect with each other, weakly decoupled electronically and laterally twisted forming grain boundaries. We emphasize experiments that atomically resolve the electronic properties. (C) 2017 Elsevier B.V. All rights reserved.