• 文献标题:   Characterization of epitaxial CVD graphene on Ir(111)/alpha-Al2O3(0001) by photoelectron momentum microscopy
  • 文献类型:   Article
  • 作  者:   HASHIMOTO E, TAMURA K, YAMAGUCHI H, WATANABE T, MATSUI F, KOH S
  • 作者关键词:   graphene, ir 111, cvd, valence band photoelectron spectroscopy, photoelectron momentum microscopy, xray absorption spectroscopy
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:  
  • 被引频次:   1
  • DOI:   10.35848/1347-4065/ac4ad8
  • 出版年:   2022

▎ 摘  要

We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/alpha-Al2O3(0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray absorption spectroscopy, is a complementary characterization tool to conventional methods, such as Raman spectroscopy and atomic force microscopy, for comprehensive and quantitative characterization of graphene/Ir(111). Using PMM, we characterized the properties of CVD-grown graphene including the single-crystallinity, number of layers, crystal orientation, and degree of interaction between graphene and Ir(111) and clarified the relationship between these properties and the CVD growth conditions.