• 文献标题:   Strain release at the graphene-Ni(100) interface investigated by in-situ and operando scanning tunnelling microscopy
  • 文献类型:   Article
  • 作  者:   ZOU ZY, PATERA LL, COMELLI G, AFRICH C
  • 作者关键词:   graphene, scanning tunneling microscopy stm, ni 100, ni2c, lattice strain, chemical vapor deposition cvd
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:  
  • 被引频次:   9
  • DOI:   10.1016/j.carbon.2020.10.019
  • 出版年:   2021

▎ 摘  要

Interface strain can significantly influence the mechanical, electronic and magnetic properties of lowdimensional materials. Here we investigated by scanning tunneling microscopy how the stress introduced by a mismatched interface affects the structure of a growing graphene (Gr) layer on a Ni(100) surface in real time during the process. Strain release appears to be the main factor governing morphology, with the interplay of two simultaneous driving forces: on the one side the need to obtain two-dimensional best registry with the substrate, via formation of moire patterns, on the other side the requirement of optimal one-dimensional in-plane matching with the transforming nickel carbide layer, achieved by local rotation of the growing Gr flake. Our work suggests the possibility of tuning the local properties of two-dimensional films at the nanoscale through exploitation of strain at a one-dimensional interface. (C) 2020 Elsevier Ltd. All rights reserved.