• 文献标题:   Raman Monitoring of Strain Induced Effects in Mechanically Deposited Single Layer Graphene
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   RUSSO P, COMPAGNINI G, MUSUMECI C, PIGNATARO B
  • 作者关键词:   graphene, raman spectroscopy, exfoliation, defect
  • 出版物名称:   JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
  • ISSN:   1533-4880 EI 1533-4899
  • 通讯作者地址:   Univ Catania
  • 被引频次:   8
  • DOI:   10.1166/jnn.2012.6827
  • 出版年:   2012

▎ 摘  要

Graphene is a two dimensional building block for carbon allotropes of many other dimensionality and shows remarkable electronic and optical properties that attract enormous interest. In order to make graphene useful for real technology, a control of its electronic and mechanical properties is a must. In this respect, a crucial step for the use of graphene layers in device fabrication is the deposition onto suitable substrates, understanding the interaction with them. Micromechanical cleavage of graphite has been used to produce high-quality graphene sheets. The aim of this work is to study the strain effects induced in graphene by the deposition process using Raman spectroscopy and scanning force microscopy. The study reveals that this deposition method randomly produces strained and unstrained graphene sheets, which can be distinguished through an appropriate analysis of the Raman spectra using polarized incident light. We have also observed that the induced strain can be partially restored under thermal treatments.