• 文献标题:   Monitoring the Layer-by-Layer Self-Assembly of Graphene and Graphene Oxide by Spectroscopic Ellipsometry
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   ZHOU KG, CHANG MJ, WANG HX, XIE YL, ZHANG HL
  • 作者关键词:   variable angle spectroscopic ellipsometry, graphene, copper phthalocyanine, layerbylayer self assembly
  • 出版物名称:   JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
  • ISSN:   1533-4880 EI 1533-4899
  • 通讯作者地址:   Lanzhou Univ
  • 被引频次:   6
  • DOI:   10.1166/jnn.2012.5335
  • 出版年:   2012

▎ 摘  要

Thin films of graphene oxide, graphene and copper (II) phthalocyanine dye have been successfully fabricated by electrostatic layer-by-layer (LbL) assembly approach. We present the first variable angle spectroscopic ellipsometry (VASE) investigation on these graphene-dye hybrid thin films. The thickness evaluation suggested that our LbL assembly process produces highly uniform and reproducible thin films. We demonstrate that the refractive indices of the graphene-dye thin films undergo dramatic variation in the range close to the absorption of the dyes. This investigation provides new insight to the optical properties of graphene containing thin films and shall help to establish an appropriate optical model for graphene-based hybrid materials.