• 文献标题:   Channel-Length-Dependent Transport Behaviors of Graphene Field-Effect Transistors
  • 文献类型:   Article
  • 作  者:   HAN SJ, CHEN ZH, BOL AA, SUN YN
  • 作者关键词:   chemical vapor deposition cvd graphene, dirac point, graphene fieldeffect transistor gfet, shortchannel effect
  • 出版物名称:   IEEE ELECTRON DEVICE LETTERS
  • ISSN:   0741-3106 EI 1558-0563
  • 通讯作者地址:   IBM TJ Watson Res Ctr
  • 被引频次:   55
  • DOI:   10.1109/LED.2011.2131113
  • 出版年:   2011

▎ 摘  要

This letter presents a detailed study of transport in graphene field-effect transistors (GFETs) with various channel lengths, from 5 mu m down to 90 nm, using transferred graphene grown by chemical vapor deposition. An electron-hole asymmetry observed in short-channel devices suggests a strong impact from graphene/metal contacts. In addition, for the first time, we observe a shift of the gate voltage at the Dirac point in graphene devices as a consequence of gate length scaling. The unusual shift of the Dirac point voltage has been identified as one of the signatures of short-channel effects in GFETs.