▎ 摘　　要

Physically unclonable functions (PUFs) are an integralpart ofmodern-day hardware security. Various types of PUFs already exist,including optical, electronic, and magnetic PUFs. Here, we introducea novel straintronic PUF (SPUF) by exploiting strain-induced reversiblecracking in the contact microstructures of graphene field-effect transistors(GFETs). We found that strain cycling in GFETs with a piezoelectricgate stack and high-tensile-strength metal contacts can lead to anabrupt transition in some GFET transfer characteristics, whereas otherGFETs remain resilient to strain cycling. Strain sensitive GFETs showcolossal ON/OFF current ratios >10(7), whereas strain-resilientGFETs show ON/OFF current ratios <10. We fabricated a total of25 SPUFs, each comprising 16 GFETs, and found near-ideal performance.SPUFs also demonstrated resilience to regression-based machine learning(ML) attacks in addition to supply voltage and temporal stability.Our findings highlight the opportunities for emerging straintronicdevices in addressing some of the critical needs of the microelectronicsindustry.