• 文献标题:   Transport scattering time probed through rf admittance of a graphene capacitor
  • 文献类型:   Article
  • 作  者:   PALLECCHI E, BETZ AC, CHASTE J, FEVE G, HUARD B, KONTOS T, BERROIR JM, PLACAIS B
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Univ D Diderot
  • 被引频次:   19
  • DOI:   10.1103/PhysRevB.83.125408
  • 出版年:   2011

▎ 摘  要

We have investigated electron dynamics in top gated graphene by measuring the gate admittance of a diffusive graphene capacitor in a broad frequency range as a function of carrier density. The density of states, conductivity, and diffusion constant are deduced from the low-frequency gate capacitance, its charging time, and their ratio. The admittance evolves from an rc-like to a skin-effect response at GHz frequency with a crossover given by the Thouless energy. The scattering time is found to be independent of energy in the 0- to 200-meV investigated range at room temperature. This is consistent with a random mass model for Dirac fermions.