• 文献标题:   Modified UNet plus plus with attention gate for graphene identification by optical microscopy
  • 文献类型:   Article
  • 作  者:   YANG B, WU MX, TEIZER W
  • 作者关键词:   graphene, deep learning, attention gate, unet plus plu
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:  
  • 被引频次:   4
  • DOI:   10.1016/j.carbon.2022.03.035 EA APR 2022
  • 出版年:   2022

▎ 摘  要

Graphene has attracted a lot of interest since its discovery. However, graphene layers made by me-chanical exfoliation need to be carefully distinguished from multi-layer graphite and residues by expe-rienced experts, which is time consuming and requires significant experience. In this paper, an image segmentation method based on deep learning is developed to identify single-layer graphene (SLG) under an optical microscope. By introducing a modified UNet++ with an attention gate and a residue network (ResNet) for further classification as a two-level structure, we can distinguish SLG from graphite with high accuracy by using only a small amount of training images. The high accuracy of SLG identification and the short inference time make it a promising real-time detection tool besides traditional and technically more involved identification methods such as Raman spectroscopy and atomic force microscopy. (c) 2022 Elsevier Ltd. All rights reserved.