• 文献标题:   Direct measurement of strain-driven Kekule distortion in graphene and its electronic properties
  • 文献类型:   Article
  • 作  者:   EOM D, KOO JY
  • 作者关键词:  
  • 出版物名称:   NANOSCALE
  • ISSN:   2040-3364 EI 2040-3372
  • 通讯作者地址:   Korea Res Inst Stand Sci
  • 被引频次:   2
  • DOI:   10.1039/d0nr03565c
  • 出版年:   2020

▎ 摘  要

Kekule distortion in graphene is a subject of extensive theoretical studies due to its non-trivial material properties. Yet, experimental observation of its formation mechanism and electronic structures is still elusive. Here, we used scanning tunneling microscopy to visualize two different phases of the Kekule distortion in graphene along with experimental evidence that local strain is responsible for the formation of such distortions. In addition, we directly measured the electronic structures of the two phases of the Kekule distortion in graphene revealing that one opens an energy gap whereas the other maintains a linear density profile. These are consistent with the calculated band structures of the two phases of the Kekule distortion, respectively, providing a direct verification of the theoretical predictions.